发明申请
US20110019199A1 METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING HIGH-PRECISION MACH-ZEHNDER INTERFEROMETERS
有权
具有高精度MACH-ZEHNDER干涉仪的光学调制器特性评估方法
- 专利标题： METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING HIGH-PRECISION MACH-ZEHNDER INTERFEROMETERS
- 专利标题（中）： 具有高精度MACH-ZEHNDER干涉仪的光学调制器特性评估方法
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申请号： US12921235申请日： 2008-03-07
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公开(公告)号： US20110019199A1公开(公告)日： 2011-01-27
- 发明人: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- 申请人： Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- 申请人地址： JP Koganei-shi ,Tokyo
- 专利权人： NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- 当前专利权人： NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- 当前专利权人地址： JP Koganei-shi ,Tokyo
- 国际申请： PCT/JP2008/000483 WO 20080307
- 主分类号： G01B9/02
- IPC分类号： G01B9/02
摘要：
Problem An object is to provide a method for evaluating characteristics of individual Mach-Zehnder (MZ) interferometers in an optical modulator which includes a plurality of MZ interferometers.Means for Solving Problems The method comprises a step for adjusting a bias voltage of the MZ interferometer, a step for eliminating zero-order components, a step for measuring an output intensity and a step for evaluating characteristics. An optical modulator (1) includes the first MZ interferometer (2) and the second MZ interferometer (3). The first MZ interferometer (2) includes wave-branching section (5). Two arms (6,7), wave coupling section (8) and electrodes which is not shown in figures.
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