Invention Application
US20110019199A1 METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING HIGH-PRECISION MACH-ZEHNDER INTERFEROMETERS
有权
具有高精度MACH-ZEHNDER干涉仪的光学调制器特性评估方法
- Patent Title: METHOD FOR EVALUATING CHARACTERISTICS OF OPTICAL MODULATOR HAVING HIGH-PRECISION MACH-ZEHNDER INTERFEROMETERS
- Patent Title (中): 具有高精度MACH-ZEHNDER干涉仪的光学调制器特性评估方法
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Application No.: US12921235Application Date: 2008-03-07
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Publication No.: US20110019199A1Publication Date: 2011-01-27
- Inventor: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant Address: JP Koganei-shi ,Tokyo
- Assignee: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- Current Assignee: NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY
- Current Assignee Address: JP Koganei-shi ,Tokyo
- International Application: PCT/JP2008/000483 WO 20080307
- Main IPC: G01B9/02
- IPC: G01B9/02
Abstract:
Problem An object is to provide a method for evaluating characteristics of individual Mach-Zehnder (MZ) interferometers in an optical modulator which includes a plurality of MZ interferometers.Means for Solving Problems The method comprises a step for adjusting a bias voltage of the MZ interferometer, a step for eliminating zero-order components, a step for measuring an output intensity and a step for evaluating characteristics. An optical modulator (1) includes the first MZ interferometer (2) and the second MZ interferometer (3). The first MZ interferometer (2) includes wave-branching section (5). Two arms (6,7), wave coupling section (8) and electrodes which is not shown in figures.
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