发明申请
US20110026305A1 Non-Volatile Memory Array With Resistive Sense Element Block Erase and Uni-Directional Write
有权
具有电阻感测元件块擦除和单向写入的非易失性存储器阵列
- 专利标题: Non-Volatile Memory Array With Resistive Sense Element Block Erase and Uni-Directional Write
- 专利标题(中): 具有电阻感测元件块擦除和单向写入的非易失性存储器阵列
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申请号: US12903011申请日: 2010-10-12
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公开(公告)号: US20110026305A1公开(公告)日: 2011-02-03
- 发明人: Daniel S. Reed , Yong Lu , Andrew John Carter , Hai Li
- 申请人: Daniel S. Reed , Yong Lu , Andrew John Carter , Hai Li
- 申请人地址: US CA Scotts Valley
- 专利权人: SEAGATE TECHNOLOGY LLC
- 当前专利权人: SEAGATE TECHNOLOGY LLC
- 当前专利权人地址: US CA Scotts Valley
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; H01L21/82
摘要:
A non-volatile memory cell and associated method of use are disclosed. In accordance with various embodiments, the memory cell includes a switching device and a resistive sense element (RSE) connected in series between first and second control lines. The first control line is supplied with a variable voltage and the second control line is maintained at a fixed reference voltage. A first resistive state of the RSE is programmed by lowering the variable voltage of the first control line below the fixed reference voltage of the second control line to flow a body-drain current through the switching device. A different, second resistive state of the RSE is programmed by raising the variable voltage of the first control line above the fixed reference voltage to flow a drain-source current through the switching device.
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