发明申请
- 专利标题: Glass Thickness Measurement Using Fluorescence
- 专利标题(中): 使用荧光进行玻璃厚度测量
-
申请号: US12535850申请日: 2009-08-05
-
公开(公告)号: US20110032524A1公开(公告)日: 2011-02-10
- 发明人: William J. Furnas , Sarath K. Tennakoon , Gary C. Weber
- 申请人: William J. Furnas , Sarath K. Tennakoon , Gary C. Weber
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G01J4/00
摘要:
An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
公开/授权文献
- US08094293B2 Glass thickness measurement using fluorescence 公开/授权日:2012-01-10
信息查询