Invention Application
- Patent Title: DRIVER CIRCUIT AND TEST APPARATUS
- Patent Title (中): 驱动电路和测试装置
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Application No.: US12553755Application Date: 2009-09-03
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Publication No.: US20110050194A1Publication Date: 2011-03-03
- Inventor: Yuji KUWANA , Naoki MATSUMOTO , Yasuhiro URABE
- Applicant: Yuji KUWANA , Naoki MATSUMOTO , Yasuhiro URABE
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: G05F5/00
- IPC: G05F5/00

Abstract:
Provided is a driver circuit that outputs, from an output end, an output signal corresponding to an input signal supplied thereto, comprising an output resistance section that is provided between a constant voltage source and the output end; an output switching section that switches voltage of the output end according to the input signal; and a switching section that switches a resistance value of the output resistance section. The output resistance section includes an output resistance FET having a source/drain connection between the constant voltage source and the output end, and the switching section supplies a control voltage to a gate of the output resistance FET such that the resistance between the source and the drain of the output resistance FET switches to a designated value.
Public/Granted literature
- US08368366B2 Driver circuit and test apparatus Public/Granted day:2013-02-05
Information query
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