发明申请
- 专利标题: INSPECTING SYSTEM AND INSPECTING METHOD
- 专利标题(中): 检查系统和检查方法
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申请号: US12889124申请日: 2010-09-23
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公开(公告)号: US20110069320A1公开(公告)日: 2011-03-24
- 发明人: Atsushi Miyake
- 申请人: Atsushi Miyake
- 申请人地址: JP Osaka
- 专利权人: KDE CORPORATION
- 当前专利权人: KDE CORPORATION
- 当前专利权人地址: JP Osaka
- 优先权: JP2009-218686 20090924
- 主分类号: G01B11/24
- IPC分类号: G01B11/24
摘要:
An object of the present invention is to apply a phase shift method to a workpiece having a rough surface to accurately detect an abnormal concave-convex irregularity. Therefore, in an inspecting system of the present invention, an image of a stripe pattern reflected on an inspection target surface is detected at a shallow angle, and one or more continuous unit stripes of a unit stripes reflected image is specified among from the stripe pattern reflected images existing in a predetermined distance range counted from the edge in a closer side to the workpiece. Then, the phase of the specified unit stripes reflected image is varied to apply a phase shift method and scan the inspection target surface with the unit stripes reflected image to thereby detect the abnormal concave-convex irregularity.
公开/授权文献
- US08089636B2 Inspecting system and inspecting method 公开/授权日:2012-01-03
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