发明申请
US20110069320A1 INSPECTING SYSTEM AND INSPECTING METHOD 有权
检查系统和检查方法

  • 专利标题: INSPECTING SYSTEM AND INSPECTING METHOD
  • 专利标题(中): 检查系统和检查方法
  • 申请号: US12889124
    申请日: 2010-09-23
  • 公开(公告)号: US20110069320A1
    公开(公告)日: 2011-03-24
  • 发明人: Atsushi Miyake
  • 申请人: Atsushi Miyake
  • 申请人地址: JP Osaka
  • 专利权人: KDE CORPORATION
  • 当前专利权人: KDE CORPORATION
  • 当前专利权人地址: JP Osaka
  • 优先权: JP2009-218686 20090924
  • 主分类号: G01B11/24
  • IPC分类号: G01B11/24
INSPECTING SYSTEM AND INSPECTING METHOD
摘要:
An object of the present invention is to apply a phase shift method to a workpiece having a rough surface to accurately detect an abnormal concave-convex irregularity. Therefore, in an inspecting system of the present invention, an image of a stripe pattern reflected on an inspection target surface is detected at a shallow angle, and one or more continuous unit stripes of a unit stripes reflected image is specified among from the stripe pattern reflected images existing in a predetermined distance range counted from the edge in a closer side to the workpiece. Then, the phase of the specified unit stripes reflected image is varied to apply a phase shift method and scan the inspection target surface with the unit stripes reflected image to thereby detect the abnormal concave-convex irregularity.
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