发明申请
- 专利标题： Capacitance Measurement Circuit and Method Therefor
- 专利标题（中）： 电容测量电路及其方法
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申请号： US12884886申请日： 2010-09-17
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公开(公告)号： US20110074446A1公开(公告)日： 2011-03-31
- 发明人: Shih-Tzung Chou , Yong-Nien Rao , Yu Kuang
- 申请人： Shih-Tzung Chou , Yong-Nien Rao , Yu Kuang
- 申请人地址： TW Hsinchu
- 专利权人： RAYDIUM SEMICONDUCTOR CORPORATION
- 当前专利权人： RAYDIUM SEMICONDUCTOR CORPORATION
- 当前专利权人地址： TW Hsinchu
- 优先权： TW98133153 20090930
- 主分类号： G01R27/26
- IPC分类号： G01R27/26
摘要：
A capacitance measurement circuit includes an operation amplifier; a reference capacitor having a first terminal coupled to a first input terminal of the operation amplifier and a second terminal selectively coupled to a first or second reference voltage; a sensor capacitor having a first terminal coupled to a second input terminal of the operation amplifier and a second terminal selectively coupled to the first or second reference voltage; an approximation unit having an output terminal and an input terminal coupled to an output terminal of the operation amplifier; a conversion unit having an output terminal and an input terminal coupled to the output terminal of the approximation unit; and a coupling capacitor having a first terminal coupled to the first or second input terminal of the operation amplifier and a second terminal coupled to the output terminal of the conversion unit.
公开/授权文献
- US08384400B2 Capacitance measurement circuit and method therefor 公开/授权日：2013-02-26