发明申请
- 专利标题： Resistance Measurement in High Power Apparatus Environments
- 专利标题（中）： 大功率设备环境中的电阻测量
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申请号： US12937271申请日： 2009-04-21
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公开(公告)号： US20110084715A1公开(公告)日： 2011-04-14
- 发明人: Zoran Stanisic , Heinz Wernli , Romain Douib , Nils Wacklen
- 申请人： Zoran Stanisic , Heinz Wernli , Romain Douib , Nils Wacklen
- 申请人地址： SE Taby
- 专利权人： MEGGER SWEDEN AB
- 当前专利权人： MEGGER SWEDEN AB
- 当前专利权人地址： SE Taby
- 国际申请： PCT/SE2009/050410 WO 20090421
- 主分类号： G01R27/08
- IPC分类号： G01R27/08
摘要：
A measuring device for measuring the resistance of high power apparatuses comprises a current source connect-able to a test object, and means for measuring, wherein the current source is a capacitor. By providing the current source as a capacitor, a light weight device is obtained which can be used essentially continuously without periods of non-use during recharging.
公开/授权文献
- US08497692B2 Resistance measurement in high power apparatus environments 公开/授权日：2013-07-30
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