发明申请
US20110085160A1 SPECTRAL DETECTOR WITH ANGULAR RESOLUTION USING REFRACTIVE AND REFLECTIVE STRUCTURES
审中-公开
具有折射和反射结构的光栅分辨率的光谱检测器
- 专利标题: SPECTRAL DETECTOR WITH ANGULAR RESOLUTION USING REFRACTIVE AND REFLECTIVE STRUCTURES
- 专利标题(中): 具有折射和反射结构的光栅分辨率的光谱检测器
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申请号: US12995487申请日: 2009-06-09
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公开(公告)号: US20110085160A1公开(公告)日: 2011-04-14
- 发明人: Ties Van Bommel , Eduard Johannes Meijer , Rifat Ata Mustafa Hikmet
- 申请人: Ties Van Bommel , Eduard Johannes Meijer , Rifat Ata Mustafa Hikmet
- 优先权: EP08104428.1 20080616
- 国际申请: PCT/IB2009/052431 WO 20090609
- 主分类号: G01B11/26
- IPC分类号: G01B11/26
摘要:
A detector for receiving light impinging at a reception point and for measuring, for a plurality of angles of incidence, at least one property of the light. The detector includes a plurality of light sensors, each of which is associated with an acceptance interval (which defines the angle of incidence which a light beam must have to reach the light sensor) and at least two acceptance intervals are different from one another. The detector further includes an optical conductor for conducting a light beam from the reception point to a particular light sensor, but only if the angle of incidence of the light beam belongs to the acceptance interval associated with the particular light sensor.
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