发明申请
US20110098942A1 SYSTEM AND METHODS TO DETERMINE AND MONITOR CHANGES IN MICROSTRUCTURAL PROPERTIES
审中-公开
微结构特性决定和监测变化的系统和方法
- 专利标题: SYSTEM AND METHODS TO DETERMINE AND MONITOR CHANGES IN MICROSTRUCTURAL PROPERTIES
- 专利标题(中): 微结构特性决定和监测变化的系统和方法
-
申请号: US12984291申请日: 2011-01-04
-
公开(公告)号: US20110098942A1公开(公告)日: 2011-04-28
- 发明人: Joseph Alan Turner
- 申请人: Joseph Alan Turner
- 申请人地址: US NE Lincoln
- 专利权人: Board of Regents of the University of Nebraska
- 当前专利权人: Board of Regents of the University of Nebraska
- 当前专利权人地址: US NE Lincoln
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G01L1/00 ; G01N29/04
摘要:
A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.
公开/授权文献
信息查询