发明申请
US20110101538A1 CREATION OF VIAS AND TRENCHES WITH DIFFERENT DEPTHS 失效
创造不同深度的VIAS和TRENCHES

CREATION OF VIAS AND TRENCHES WITH DIFFERENT DEPTHS
摘要:
Embodiments of the invention provide a method of creating vias and trenches with different length. The method includes depositing a plurality of dielectric layers on top of a semiconductor structure with the plurality of dielectric layers being separated by at least one etch-stop layer; creating multiple openings from a top surface of the plurality of dielectric layers down into the plurality of dielectric layers by a non-selective etching process, wherein at least one of the multiple openings has a depth below the etch-step layer; and continuing etching the multiple openings by a selective etching process until one or more openings of the multiple openings that are above the etch-stop layer reach and expose the etch-stop layer. Semiconductor structures made thereby are also provided.
公开/授权文献
信息查询
0/0