发明申请
- 专利标题: FOREIGN MATTER INSPECTION APPARATUS
- 专利标题(中): 外部检验装置
-
申请号: US13009366申请日: 2011-01-19
-
公开(公告)号: US20110109901A1公开(公告)日: 2011-05-12
- 发明人: Eiji IMAI , Masami Ooyama , Hideyuki Okamoto , Hiroyuki Yamashita
- 申请人: Eiji IMAI , Masami Ooyama , Hideyuki Okamoto , Hiroyuki Yamashita
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2006-342409 20061220; JP2006-350814 20061227
- 主分类号: G01N21/94
- IPC分类号: G01N21/94
摘要:
Selection with alignment marks of an optimal template, its identification and similarity judgment are conducted by a calculation function of a correlation value provided to a foreign matter inspection apparatus. In other words, the foreign matter inspection apparatus includes unit for registering feature points of alignment marks formed on a surface of an inspected object, unit for collecting image data of the alignment marks formed on the surface of the inspected object and a data processor for extracting a feature point from the image data and calculating a correlation value of both feature points, and registers the image data of the alignment mark on the basis of a threshold value of the correlation value.
公开/授权文献
- US08395766B2 Foreign matter inspection apparatus 公开/授权日:2013-03-12
信息查询