发明申请
- 专利标题: Apparatus and method for evaluating capacitor
- 专利标题(中): 电容器评估装置及方法
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申请号: US12662717申请日: 2010-04-29
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公开(公告)号: US20110133757A1公开(公告)日: 2011-06-09
- 发明人: Kyoung Soo Chae , Hyun Chul Jung , Hee Bum Lee
- 申请人: Kyoung Soo Chae , Hyun Chul Jung , Hee Bum Lee
- 申请人地址: KR Suwon
- 专利权人: SAMSUNG ELECTRO-MECHANICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRO-MECHANICS CO., LTD.
- 当前专利权人地址: KR Suwon
- 优先权: KR10-2009-0119904 20091204
- 主分类号: G01R27/26
- IPC分类号: G01R27/26
摘要:
There is provided an apparatus for evaluating a capacitor, including: a charge/discharge control unit 100 that controls charge and discharge, a charge/discharge switch 200 that selects a connection between a capacitor CSP to be measured and a power supply unit 50 or a connection between the capacitor CSP and a discharge path DP, a discharge unit 300 that is connected to the discharge path DP and provides discharge resistance for the discharge of the capacitor CSP, a voltage measuring unit 400 that measures the voltage of the capacitor CSP, a current measuring unit 500 that measures the charge current or discharge current of the capacitor CSP, and a main control unit 600 that controls the charge and discharge through the charge/discharge control unit 100 and obtains equivalent series resistance Res, capacitance C and self discharge resistance Rsd during the charge and discharge.
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