发明申请
- 专利标题: TESTING APPARATUS
- 专利标题(中): 测试装置
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申请号: US12699898申请日: 2010-02-04
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公开(公告)号: US20110140332A1公开(公告)日: 2011-06-16
- 发明人: SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN , HSIEN-CHUAN LIANG
- 申请人: SHEN-CHUN LI , SHOU-KUO HSU , YUNG-CHIEH CHEN , HSIEN-CHUAN LIANG
- 申请人地址: TW Tu-Cheng
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: TW Tu-Cheng
- 优先权: CN200910311368.9 20091214
- 主分类号: B25B1/24
- IPC分类号: B25B1/24 ; A47B13/08 ; A47B37/00 ; B25H1/04 ; B25H1/08
摘要:
A testing apparatus is for testing products on an assembly line and includes a worktable, a positioning device, and a testing member. The worktable includes a number of wheels pivotably attached to a bottom thereof, and a number of retractable feet attached to the bottom thereof. The positioning device is attached to the worktable and includes a number of clamping members to position a product to be test. The testing member is attached to the worktable and operated by a control box to move a robot arm with a testing head to test the product.
公开/授权文献
- US08226073B2 Testing apparatus 公开/授权日:2012-07-24