发明申请
US20110148402A1 INSPECTION MODE SWITCHING CIRCUIT 有权
检查模式切换电路

INSPECTION MODE SWITCHING CIRCUIT
摘要:
An eddy current probe testing apparatus structured to operate concurrently in a driver pick-up mode and said impedance mode is provided. The eddy current probe has two coils. The eddy current probe testing apparatus also includes a signal producing device, an output device, and a switch assembly. The switch assembly is structured to switch how an input signal from the signal producing device is provided to the two coils.
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