Invention Application
US20110148404A1 METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURRENT TESTING
有权
用于评估EDDY电流测试中缺陷长度的方法和装置
- Patent Title: METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURRENT TESTING
- Patent Title (中): 用于评估EDDY电流测试中缺陷长度的方法和装置
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Application No.: US13028500Application Date: 2011-02-16
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Publication No.: US20110148404A1Publication Date: 2011-06-23
- Inventor: Akira NISHIMIZU , Yoshio Nonaka , Isao Yoshida , Motoyuki Nakamura , Akihiro Taki , Masahiro Koike
- Applicant: Akira NISHIMIZU , Yoshio Nonaka , Isao Yoshida , Motoyuki Nakamura , Akihiro Taki , Masahiro Koike
- Priority: JP2006-180640 20060630
- Main IPC: G01R33/12
- IPC: G01R33/12

Abstract:
The surface length of a metal subject to be inspected is evaluated by detecting an eddy current without using a combination of a scale and visual or liquid penetrant inspection. An exciting coil and a detecting coil are scanned above the subject in a length direction. An eddy current detector measures an output voltage corresponding to scanning positions based on an output from the detecting coil. Based on an output voltage distribution curve indicating a distribution of output voltages corresponding to the scanning positions, position information is extracted corresponding to values which are within a differential voltage range and lower by 12 dB than a maximum value of the output voltages on the left and right sides of the distribution. A distance between the positions included in the extracted information is calculated to evaluate the length of a slit which is a defect present on the subject surface.
Public/Granted literature
- US08339130B2 Method and apparatus for evaluating length of defect in eddy current testing Public/Granted day:2012-12-25
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