发明申请
- 专利标题： Method to detect Beryllium by Flourescence
- 专利标题（中）： 通过荧光检测铍的方法
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申请号： US12978483申请日： 2010-12-24
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公开(公告)号： US20110165696A1公开(公告)日： 2011-07-07
- 发明人: Anoop Agrawal , John P. Cronin , Juan Carlos Lopez Tonazzi
- 申请人： Anoop Agrawal , John P. Cronin , Juan Carlos Lopez Tonazzi
- 申请人地址： US AZ Tucson
- 专利权人： Berylliant, Inc.
- 当前专利权人： Berylliant, Inc.
- 当前专利权人地址： US AZ Tucson
- 主分类号： G01N33/84
- IPC分类号： G01N33/84
摘要：
A method of determining beryllium or a beryllium compound thereof in a sample is disclosed by measuring fluorescence. This method discloses improved sample preparation methods, particularly for refractory beryllium materials. The method also discloses methods to improve the detection limit of beryllium including use of optical filters with specific characteristics for selecting the emission wavelengths of the fluorescence signal.
公开/授权文献
- US08450117B2 Method to detect beryllium by fluorescence 公开/授权日：2013-05-28
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