发明申请
US20110170389A1 OPTICAL INFORMATION MEDIUM MEASUREMENT METHOD, OPTICAL INFORMATION METHOD, OPTICAL INFORMATION MEDIUM, RECORDING APPARATUS, AND REPRODUCING APPARATUS 有权
光学信息中度测量方法,光学信息方法,光学信息介质,记录装置和再现装置

  • 专利标题: OPTICAL INFORMATION MEDIUM MEASUREMENT METHOD, OPTICAL INFORMATION METHOD, OPTICAL INFORMATION MEDIUM, RECORDING APPARATUS, AND REPRODUCING APPARATUS
  • 专利标题(中): 光学信息中度测量方法,光学信息方法,光学信息介质,记录装置和再现装置
  • 申请号: US13071914
    申请日: 2011-03-25
  • 公开(公告)号: US20110170389A1
    公开(公告)日: 2011-07-14
  • 发明人: Kousei SanoYoshiaki KommaYasumori Hino
  • 申请人: Kousei SanoYoshiaki KommaYasumori Hino
  • 优先权: JP2008-311332 20081205
  • 主分类号: G11B7/00
  • IPC分类号: G11B7/00
OPTICAL INFORMATION MEDIUM MEASUREMENT METHOD, OPTICAL INFORMATION METHOD, OPTICAL INFORMATION MEDIUM, RECORDING APPARATUS, AND REPRODUCING APPARATUS
摘要:
An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.
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