发明申请
- 专利标题: PROBE APPARATUS
- 专利标题(中): 探测器
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申请号: US12784511申请日: 2010-05-21
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公开(公告)号: US20110179660A1公开(公告)日: 2011-07-28
- 发明人: SHEN-CHUN LI , SHOU-KUO HSU , HSIEN-CHUAN LIANG , YING-TSO LAI
- 申请人: SHEN-CHUN LI , SHOU-KUO HSU , HSIEN-CHUAN LIANG , YING-TSO LAI
- 申请人地址: TW Tu-Cheng
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: TW Tu-Cheng
- 优先权: CN201010300633.6 20100123
- 主分类号: G01B5/00
- IPC分类号: G01B5/00 ; F16H1/18
摘要:
An exemplary probe apparatus includes a fixture, a first probe assembly, a motor, a lead screw, two guide members, a second probe, and a reduction gear unit. The first probe assembly is fixedly attached to the fixture and includes a first probe. The motor has a drive shaft attached to the fixture. The lead screw is coupled to the fixture. The two guide members are attached to the fixture and parallel to the lead screw. The second probe assembly is moveably attached to the lead screw and the at least one guide member, and includes a second probe. The reduction gear unit is coupled to the drive shaft and the lead screw to transmit power from the motor to the second probe assembly through the lead screw. The second probe assembly is configured for moving the second probe towards or away from the first probe along the two guide members.
公开/授权文献
- US08272141B2 Probe apparatus 公开/授权日:2012-09-25
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