发明申请
- 专利标题: DETERMINING A POSITION OF A SUBAREA OF AN OBJECT UNDER EXAMINATION AND THE STRUCTURE THEREOF IN A MAGNETIC RESONANCE SYSTEM
- 专利标题(中): 确定磁性谐振系统中检查对象的子系统及其结构的位置
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申请号: US13015065申请日: 2011-01-27
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公开(公告)号: US20110187364A1公开(公告)日: 2011-08-04
- 发明人: Jan Ole BLUMHAGEN , Matthias Fenchel , Ralf Ladebeck
- 申请人: Jan Ole BLUMHAGEN , Matthias Fenchel , Ralf Ladebeck
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 优先权: DE102010006431.9 20100201
- 主分类号: G01R33/48
- IPC分类号: G01R33/48
摘要:
A method is disclosed for determining a location of a subarea of an area under examination in a magnetic resonance system. The subarea is arranged at the edge of a field-of-view of the magnetic resonance system. In at least one embodiment of the method, at least one slice position is determined for an MR image in which the B0 field at the edge of the MR image satisfies a homogeneity value. For the slice position determined an MR image is acquired which contains the subarea at the edge of the field-of-view and the location of the subarea of the object under examination is determined through the location of the subarea in the MR image.
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