发明申请
US20110187364A1 DETERMINING A POSITION OF A SUBAREA OF AN OBJECT UNDER EXAMINATION AND THE STRUCTURE THEREOF IN A MAGNETIC RESONANCE SYSTEM 有权
确定磁性谐振系统中检查对象的子系统及其结构的位置

DETERMINING A POSITION OF A SUBAREA OF AN OBJECT UNDER EXAMINATION AND THE STRUCTURE THEREOF IN A MAGNETIC RESONANCE SYSTEM
摘要:
A method is disclosed for determining a location of a subarea of an area under examination in a magnetic resonance system. The subarea is arranged at the edge of a field-of-view of the magnetic resonance system. In at least one embodiment of the method, at least one slice position is determined for an MR image in which the B0 field at the edge of the MR image satisfies a homogeneity value. For the slice position determined an MR image is acquired which contains the subarea at the edge of the field-of-view and the location of the subarea of the object under examination is determined through the location of the subarea in the MR image.
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