发明申请
US20110188724A1 CT MEASUREMENT WITH MULTIPLE X-RAY SOURCES 有权
CT测量与多个X射线源

CT MEASUREMENT WITH MULTIPLE X-RAY SOURCES
摘要:
A method is disclosed for reconstructing image data of an examination object from measurement data of a computed tomography system, the examination object having been irradiated simultaneously by a number of X-ray sources while the measurement data was being acquired so that different projections of the examination object associated with the number of X-ray sources were acquired simultaneously for each detector element. In at least one embodiment, different iteration images of the examination object are determined one after the other from the measurement data by way of an iterative algorithm, a computation operation being employed with the iterative algorithm, which is applied to the iteration images and takes the presence of the number of X-ray sources into account.
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