发明申请
- 专利标题: CT MEASUREMENT WITH MULTIPLE X-RAY SOURCES
- 专利标题(中): CT测量与多个X射线源
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申请号: US13020256申请日: 2011-02-03
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公开(公告)号: US20110188724A1公开(公告)日: 2011-08-04
- 发明人: Herbert Bruder , Karl Stierstorfer
- 申请人: Herbert Bruder , Karl Stierstorfer
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 优先权: DE102010006774.1 20100204
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; A61B6/03
摘要:
A method is disclosed for reconstructing image data of an examination object from measurement data of a computed tomography system, the examination object having been irradiated simultaneously by a number of X-ray sources while the measurement data was being acquired so that different projections of the examination object associated with the number of X-ray sources were acquired simultaneously for each detector element. In at least one embodiment, different iteration images of the examination object are determined one after the other from the measurement data by way of an iterative algorithm, a computation operation being employed with the iterative algorithm, which is applied to the iteration images and takes the presence of the number of X-ray sources into account.
公开/授权文献
- US08768030B2 CT measurement with multiple X-ray sources 公开/授权日:2014-07-01
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