发明申请
US20110191055A1 METHOD AND APPARATUS FOR SELECTING VOLTAGE AND FREQUENCY LEVELS FOR USE IN AT-SPEED TESTING
失效
用于选择在速度测试中使用的电压和频率水平的方法和装置
- 专利标题： METHOD AND APPARATUS FOR SELECTING VOLTAGE AND FREQUENCY LEVELS FOR USE IN AT-SPEED TESTING
- 专利标题（中）： 用于选择在速度测试中使用的电压和频率水平的方法和装置
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申请号： US12696902申请日： 2010-01-29
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公开(公告)号： US20110191055A1公开(公告)日： 2011-08-04
- 发明人: JOSE MARTINEZ , Chandramouli Visweswariah , Francis Woytowich , Jinjun Xiong
- 申请人： JOSE MARTINEZ , Chandramouli Visweswariah , Francis Woytowich , Jinjun Xiong
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F19/00
- IPC分类号： G06F19/00 ; G01R31/00 ; G06F17/18
摘要：
In one embodiment, the invention is a method and apparatus for selecting voltage and frequency levels for use in at-speed testing. One embodiment of a method for selecting a set of test conditions with which to test an integrated circuit chip includes formulating a statistical optimization problem and obtaining a solution to the statistical optimization problem, where the solution is the set of test conditions.
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