发明申请
- 专利标题: Time-Of-Flight Mass Spectrometer
- 专利标题(中): 飞行时间质谱仪
-
申请号: US13119155申请日: 2008-09-16
-
公开(公告)号: US20110192972A1公开(公告)日: 2011-08-11
- 发明人: Osamu Furuhashi , Shinichi Yamaguchi , Hideaki Izumi
- 申请人: Osamu Furuhashi , Shinichi Yamaguchi , Hideaki Izumi
- 申请人地址: JP Kyoto-shi, Kyoto
- 专利权人: SHIMADZU CORPORATION
- 当前专利权人: SHIMADZU CORPORATION
- 当前专利权人地址: JP Kyoto-shi, Kyoto
- 国际申请: PCT/JP2008/002541 WO 20080916
- 主分类号: H01J49/40
- IPC分类号: H01J49/40
摘要:
A first mass analysis is executed in a condition that gas is not introduced into a loop-flight chamber (4), and a time-of-flight spectrum obtained in a data processor (12) is stored in a storage unit (13). Next, a second mass analysis is executed on the same sample as the one used in the first mass analysis in a condition that a valve (8) is opened and helium gas (He) is introduced into the loop-flight chamber (4), and the time-of-flight spectrum is obtained in the data processor (12). If different kinds of ions having the same m/z value exit, these ions form a single peak in the first time-of-flight spectrum, while these ions appear as separate peaks in the second time-of-flight spectrum even though they have the same m/z value. This is because, in the second mass analysis, the ions collide with the gas and have different times of flight depending on their difference in size. A spectrum comparator (14) judges a change in the position or shape of the peak by comparing the two spectra, and outputs information relating to the difference in the size of the ions (the molecular structure, charge state, or molecular class of the ions), and the like. Accordingly, a wider variety of information than ever before can be provided.
公开/授权文献
信息查询