发明申请
- 专利标题: MEASUREMENT PARAMETER INPUT CONTROL DEVICE AND MEASUREMENT PARAMETER INPUT CONTROL METHOD
- 专利标题(中): 测量参数输入控制装置和测量参数输入控制方法
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申请号: US13021949申请日: 2011-02-07
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公开(公告)号: US20110196515A1公开(公告)日: 2011-08-11
- 发明人: Yohei Niki , Eiji Takeda , Tadanori Nishikobara , Keita Masuhara , Takashi Murakami
- 申请人: Yohei Niki , Eiji Takeda , Tadanori Nishikobara , Keita Masuhara , Takashi Murakami
- 申请人地址: JP Atsugi-shi
- 专利权人: ANRITSU CORPORATION
- 当前专利权人: ANRITSU CORPORATION
- 当前专利权人地址: JP Atsugi-shi
- 优先权: JP2010-025735 20100208
- 主分类号: G05B15/00
- IPC分类号: G05B15/00
摘要:
A measurement parameter input control method and a measurement parameter input control device are provided which can intuitively change measurement parameters, which are set for a target device and are necessary for various measuring processes, with high operability. The measurement parameter input control device includes: a parameter processing section that acquires measurement parameter information including measurement parameters from a target device and that rewrites changed parameters which are measurement parameters after the changing to the target device; a parameter identifying section that identifies the types of the parameters in the acquired measurement parameter information and outputs soft key constructing information for constructing a parameter setting soft key based on the identified measurement parameter information, a display control section that includes a soft key controller displaying and controlling the parameter setting soft key based on the measurement parameter information on a display screen of a display unit on the basis of the soft key constructing information from the parameter identifying section; and an input unit that operates the parameter setting soft key displayed on the display unit.
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