发明申请
US20110210480A1 Nanostructures with anti-counterefeiting features and methods of fabricating the same 审中-公开
具有抗反射特征的纳米结构及其制造方法

  • 专利标题: Nanostructures with anti-counterefeiting features and methods of fabricating the same
  • 专利标题(中): 具有抗反射特征的纳米结构及其制造方法
  • 申请号: US13066473
    申请日: 2011-04-14
  • 公开(公告)号: US20110210480A1
    公开(公告)日: 2011-09-01
  • 发明人: Boris Kobrin
  • 申请人: Boris Kobrin
  • 申请人地址: US CA Dublin
  • 专利权人: ROLITH, INC
  • 当前专利权人: ROLITH, INC
  • 当前专利权人地址: US CA Dublin
  • 主分类号: B29C59/16
  • IPC分类号: B29C59/16
Nanostructures with anti-counterefeiting features and methods of fabricating the same
摘要:
Embodiments of the invention relate to methods of anti-counterfeiting for nanostructures and nanostructured devices. Specifically we describe a method of embedding a coded micro- or nanopatterns in nanostructures fabricated using Near-field rolling mask lithography, where areas of such features can be embedded into a transparent cylindrical or conic frame, or fabricated on the surface of flexible film laminated on the surface of the frame. Alternatively, specific coded nanofeatures distribution can be created using modulation of intensity or wavelength of the light source along the width or length of such cylinder or cone, or modulation of flexible film thickness or contact pressure between the rotatable mask and a substrate.
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