发明申请
US20110217716A1 METHOD FOR QUANTIFYING SKIN CHANGES CAUSED BY SIX EXTERNAL EVILS AND METHOD FOR SCREENING SKIN CONDITION-IMPROVING MATERIALS USING THE SAME
审中-公开
用于定量六种外部因素引起的皮肤变化的方法和使用其来筛选皮肤状况的方法 - 改善材料
- 专利标题: METHOD FOR QUANTIFYING SKIN CHANGES CAUSED BY SIX EXTERNAL EVILS AND METHOD FOR SCREENING SKIN CONDITION-IMPROVING MATERIALS USING THE SAME
- 专利标题(中): 用于定量六种外部因素引起的皮肤变化的方法和使用其来筛选皮肤状况的方法 - 改善材料
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申请号: US13128697申请日: 2009-11-05
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公开(公告)号: US20110217716A1公开(公告)日: 2011-09-08
- 发明人: Jin Young Lee , Sun Sang Kwon , Myeong Hoon Yeom , Duck Hee Kim , Han Kon Kim
- 申请人: Jin Young Lee , Sun Sang Kwon , Myeong Hoon Yeom , Duck Hee Kim , Han Kon Kim
- 优先权: KR10-2008-0111838 20081111
- 国际申请: PCT/KR2009/006480 WO 20091105
- 主分类号: C12Q1/68
- IPC分类号: C12Q1/68 ; G01N33/566 ; G01N33/53 ; C12Q1/30 ; C12Q1/32 ; C12Q1/02
摘要:
Disclosed herein are a method for quantifying skin changes caused by six external evils and a method of screening skin condition-improving materials using the quantification method. More specifically, disclosed are a method of measuring cellular changes caused by external stimuli in a skin cell culture system, in which the degree of cellular changes obtained by applying suitable stimuli of six external evils to skin cells being cultured is measured by cellular biochemical methods, such that the conceptual effects of six external evils suggested in the prior art can be scientifically and quantitatively expressed, and a method of screening skin condition-improving materials using the measurement method.
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