Identification of Critical Enables Using MEA and WAA Metrics

发明申请

US20110218779A1 Identification of Critical Enables Using MEA and WAA Metrics 有权

标题翻译：使用MEA和WAA指标确定关键任务

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专利标题： Identification of Critical Enables Using MEA and WAA Metrics
专利标题（中）： 使用MEA和WAA指标确定关键任务
申请号： US12718594

申请日： 2010-03-05
公开(公告)号： US20110218779A1

公开(公告)日： 2011-09-08
发明人: Vasant Palisetti , Rachida Kebichi , Samuel Naffziger
申请人： Vasant Palisetti , Rachida Kebichi , Samuel Naffziger
主分类号： G06F17/50
IPC分类号： G06F17/50 ; G06F17/10

Identification of Critical Enables Using MEA and WAA Metrics

摘要：

A plurality of sequential nodes in a design file for an electronic device are identified and one or more combinatorial power metric values are computed for the plurality of sequential nodes based upon an effective switching capacitance, a switching activity measure, and a power effort measure for at least a first device downstream from the each sequential node at a specified depth. The combinatorial power metric values for the plurality of sequential node are stored and compared to a target power metric value to determine if power consumption at the electronic device meets a predetermined power performance goal.

摘要（中）：

识别用于电子设备的设计文件中的多个顺序节点，并且基于有效开关电容，切换活动度量和用于在线的功率测量措施来为多个顺序节点计算一个或多个组合功率量度值至少一个在指定深度处从每个顺序节点下游的第一设备。存储多个顺序节点的组合功率度量值并将其与目标功率度量值进行比较，以确定电子设备的功耗是否满足预定功率性能目标。

公开/授权文献

US08266569B2 Identification of critical enables using MEA and WAA metrics 公开/授权日：2012-09-11

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