发明申请
US20110231173A1 SIMULATION METHOD, SIMULATION DEVICE, PROGRAM, AND NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM
有权
模拟方法，仿真器件，程序和非接线计算机可读记录介质
- 专利标题： SIMULATION METHOD, SIMULATION DEVICE, PROGRAM, AND NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM
- 专利标题（中）： 模拟方法，仿真器件，程序和非接线计算机可读记录介质
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申请号： US13022359申请日： 2011-02-07
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公开(公告)号： US20110231173A1公开(公告)日： 2011-09-22
- 发明人: Hiroshi Ikeda , Hidetoshi Matsuoka
- 申请人： Hiroshi Ikeda , Hidetoshi Matsuoka
- 申请人地址： JP Yokohama
- 专利权人： FUJITSU SEMICONDUCTOR LIMITED
- 当前专利权人： FUJITSU SEMICONDUCTOR LIMITED
- 当前专利权人地址： JP Yokohama
- 优先权： JP2010-059337 20100316
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
Disclosed is a simulation method for simulating an operation of a device. The simulation method includes specifying, by a computer, a boundary between a non-defective status and a defective status of a product in design space with a design parameter as an origin. The boundary is specified according to a search using a search indicator defined based on an operating state different from an operating state of a determination indicator that determines the non-defective status and the defective status of the operation.