发明申请
- 专利标题： Logic Built-In Self-Test Programmable Pattern Bit Mask
- 专利标题（中）： 逻辑内置自检可编程模式位掩码
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申请号： US12724527申请日： 2010-03-16
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公开(公告)号： US20110231719A1公开(公告)日： 2011-09-22
- 发明人: Hong S. Kim , Paul F. Policke , Paul Douglas Bassett
- 申请人： Hong S. Kim , Paul F. Policke , Paul Douglas Bassett
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM INCORPORATED
- 当前专利权人： QUALCOMM INCORPORATED
- 当前专利权人地址： US CA San Diego
- 主分类号： G01R31/3177
- IPC分类号： G01R31/3177 ; G06F11/25
摘要：
In a particular embodiment, a method is disclosed that includes mapping failing bit positions within multiple scan chains to memory locations of a memory mask. The method also includes executing logic built-in self-test (LBIST) testing on a semiconductor device using the memory mask to selectively mask certain results within the multiple scan chains. The results are associated with performance of LBIST testing on the semiconductor device.
公开/授权文献
- US08522097B2 Logic built-in self-test programmable pattern bit mask 公开/授权日：2013-08-27
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