发明申请
- 专利标题: LOW POWER COMPRESSION OF INCOMPATIBLE TEST CUBES
- 专利标题(中): 低功耗压缩不完全测试
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申请号: US13049829申请日: 2011-03-16
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公开(公告)号: US20110231721A1公开(公告)日: 2011-09-22
- 发明人: DARIUSZ CZYSZ , Grzegorz Mrugalski , Nilanjan Mukherjee , Janusz Rajski , Przemyslaw Szczerbicki , Jerzy Tyszer
- 申请人: DARIUSZ CZYSZ , Grzegorz Mrugalski , Nilanjan Mukherjee , Janusz Rajski , Przemyslaw Szczerbicki , Jerzy Tyszer
- 主分类号: G06F11/00
- IPC分类号: G06F11/00 ; G06F1/32
摘要:
Disclosed are representative embodiments of methods, apparatus, and systems for power aware test applications involving deterministic clustering of test cubes with conflicts. Embodiments of the disclosed technology can be used to generate low toggling parent patterns to reduce power consumption during testing an integrated circuit. The power consumption may be further reduced by generating low toggling control patterns.
公开/授权文献
- US08832512B2 Low power compression of incompatible test cubes 公开/授权日:2014-09-09