发明申请
US20110234221A1 MAGNETIC RESONANCE METHOD AND APPARATUS TO DETERMINE PHASE CORRECTION PARAMETERS 有权
磁共振方法和装置确定相位校正参数

  • 专利标题: MAGNETIC RESONANCE METHOD AND APPARATUS TO DETERMINE PHASE CORRECTION PARAMETERS
  • 专利标题(中): 磁共振方法和装置确定相位校正参数
  • 申请号: US13071778
    申请日: 2011-03-25
  • 公开(公告)号: US20110234221A1
    公开(公告)日: 2011-09-29
  • 发明人: Thorsten Feiweier
  • 申请人: Thorsten Feiweier
  • 优先权: DE102010012948.8 20100326
  • 主分类号: G01R33/48
  • IPC分类号: G01R33/48
MAGNETIC RESONANCE METHOD AND APPARATUS TO DETERMINE PHASE CORRECTION PARAMETERS
摘要:
In a magnetic resonance system and operating method to determine phase correction parameters for a phase correction in MR image data, first and second phase correction data sets are thereby acquired and correlations are calculated between data of the second phase correction data set and data of the first phase correction data set. Phase correction parameters are determined, such as coefficients of a power series that approximates a curve of a phase difference between phase curves of the second and first phase correction data sets.
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