Invention Application
- Patent Title: MEASURING SYSTEM
- Patent Title (中): 测量系统
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Application No.: US13092033Application Date: 2011-04-21
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Publication No.: US20110258868A1Publication Date: 2011-10-27
- Inventor: Pascal JORDIL , Benjamin VULLIOUD
- Applicant: Pascal JORDIL , Benjamin VULLIOUD
- Applicant Address: CH Renans
- Assignee: TESA SA
- Current Assignee: TESA SA
- Current Assignee Address: CH Renans
- Priority: EP10161096.2 20100426
- Main IPC: G01B5/008
- IPC: G01B5/008

Abstract:
An analogue scanning probe with a connector detachably connectable to a movable support of a coordinate measuring system, the scanning probe including a touch at the tip of a stylus pivotally connected to the scanning probe according to a measure axis and a position encoder delivering a measure of the tilt angle of said touch about said measure axis, the scanning probe including one articulation comprised between said connector and said measure axis arranged to allow tilting of the scanning probe or of a part of the probe scanning probe.
Public/Granted literature
- US08312635B2 Measuring system Public/Granted day:2012-11-20
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