发明申请
US20110261191A1 TEXTURED PATTERN SENSING AND DETECTION, AND USING A CHARGE-SCAVENGING PHOTODIODE ARRAY FOR THE SAME
有权
纹理图案感测和检测,并使用相同的电荷扫描光电子阵列
- 专利标题: TEXTURED PATTERN SENSING AND DETECTION, AND USING A CHARGE-SCAVENGING PHOTODIODE ARRAY FOR THE SAME
- 专利标题(中): 纹理图案感测和检测,并使用相同的电荷扫描光电子阵列
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申请号: US12640525申请日: 2009-12-17
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公开(公告)号: US20110261191A1公开(公告)日: 2011-10-27
- 发明人: Robert W. BYREN , Darin S. WILLIAMS
- 申请人: Robert W. BYREN , Darin S. WILLIAMS
- 申请人地址: US MA Waltham
- 专利权人: RAYTHEON COMPANY
- 当前专利权人: RAYTHEON COMPANY
- 当前专利权人地址: US MA Waltham
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; H01L31/18
摘要:
A system for imaging a textured surface comprising includes a photoreceptor array having: at least a first photoreceptor and a second photoreceptor, each configured to receive electromagnetic radiation reflected from the textured surface and to generate a signal corresponding thereto; wherein the photoreceptor array is configured to detect an image of the textured surface based on the relative difference between the time of arrival of the signals from the first and second photoreceptors. Methods for imaging a textured surface and fabricating a photoreceptor array structure for imaging a textured surface are also provided.
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