发明申请
- 专利标题: Laser Etch Via Formation
- 专利标题(中): 激光蚀刻通过形成
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申请号: US12768911申请日: 2010-04-28
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公开(公告)号: US20110266674A1公开(公告)日: 2011-11-03
- 发明人: Hsing-Kuo Hsia , Chih-Kuang Yu , Ching-Hua Chiu , Troy Wu
- 申请人: Hsing-Kuo Hsia , Chih-Kuang Yu , Ching-Hua Chiu , Troy Wu
- 申请人地址: TW Hsin-Chu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L21/283 ; H01L21/441
摘要:
The present disclosure provides methods for forming semiconductor devices with laser-etched vias and apparatus including the same. In one embodiment, a method of fabricating a semiconductor device includes providing a substrate having a frontside and a backside, and providing a layer above the frontside of the substrate, the layer having a different composition from the substrate. The method further includes controlling a laser power and a laser pulse number to laser etch an opening through the layer and at least a portion of the frontside of the substrate, filling the opening with a conductive material to form a via, removing a portion of the backside of the substrate to expose the via, and electrically coupling a first element to a second element with the via. A semiconductor device fabricated by such a method is also disclosed.
公开/授权文献
- US08519538B2 Laser etch via formation 公开/授权日:2013-08-27
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