发明申请
- 专利标题: CIRCUIT AND METHOD FOR MEASURING CAPACITANCE VALUE OF TOUCH SCREEN
- 专利标题(中): 用于测量触摸屏电容值的电路和方法
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申请号: US13106411申请日: 2011-05-12
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公开(公告)号: US20110279131A1公开(公告)日: 2011-11-17
- 发明人: Ji-Hun KIM , Hyun-Min SONG , Joon-Ho NA , Ki-Uk GWAK , Sang-Gug LEE
- 申请人: Ji-Hun KIM , Hyun-Min SONG , Joon-Ho NA , Ki-Uk GWAK , Sang-Gug LEE
- 申请人地址: KR Daejeon-si
- 专利权人: SILICON WORKS CO., LTD
- 当前专利权人: SILICON WORKS CO., LTD
- 当前专利权人地址: KR Daejeon-si
- 优先权: KR10-2010-0044814 20100513
- 主分类号: G01R27/26
- IPC分类号: G01R27/26
摘要:
A circuit for measuring a capacitance value of a touch screen includes: a target capacitor unit having a target capacitor charged with a target charging voltage; a target voltage control unit to charge the target capacitor; a reference capacitor unit having a reference capacitor charged with a charging reference voltage; a reference voltage control unit to charge the reference capacitor; a comparator to compare the target charging voltage and the charging reference voltage and output a transition signal at a moment when the target charging voltage becomes higher than the charging reference voltage; and a controller to receive an output signal of the comparator and a clock signal and generate a digital output signal and a control signal, wherein a capacitance value of the target capacitor is measured using a time elapsed from a time when the target capacitor is initialized to a time when the transition signal is outputted.
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