Invention Application
- Patent Title: METHOD FOR DIAGNOSING AUTISM SPECTRUM DISORDER
- Patent Title (中): 诊断光谱异常的方法
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Application No.: US13155555Application Date: 2011-06-08
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Publication No.: US20110281759A1Publication Date: 2011-11-17
- Inventor: Bai-Lin Wu , Yiping Shen , David T. Miller , Orah S. Platt
- Applicant: Bai-Lin Wu , Yiping Shen , David T. Miller , Orah S. Platt
- Applicant Address: US MA Boston
- Assignee: CHILDREN'S MEDICAL CENTER CORPORATION
- Current Assignee: CHILDREN'S MEDICAL CENTER CORPORATION
- Current Assignee Address: US MA Boston
- Main IPC: C40B30/04
- IPC: C40B30/04 ; G01N21/64 ; C12Q1/68
Abstract:
The present invention provides methods of diagnosing and/or predicting autism spectrum disorder comprising determining the presence of microdeletions and microduplications on chromosomes 15 and 16.
Public/Granted literature
- US10100359B2 Method for diagnosing autism spectrum disorder Public/Granted day:2018-10-16
Information query
