发明申请
- 专利标题: Parallelized Ray Tracing
- 专利标题(中): 并行光线跟踪
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申请号: US12784525申请日: 2010-05-21
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公开(公告)号: US20110285710A1公开(公告)日: 2011-11-24
- 发明人: Eric O. Mejdrich , Paul E. Schardt , Robert A. Shearer , Matthew R. Tubbs
- 申请人: Eric O. Mejdrich , Paul E. Schardt , Robert A. Shearer , Matthew R. Tubbs
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06T15/50
- IPC分类号: G06T15/50
摘要:
A method includes assigning a priority to a ray data structure of a plurality of ray data structures based on one or more priorities. The ray data structure includes properties of a ray to be traced from an illumination source in a three-dimensional image. The method includes identifying a portion of the three-dimensional image through which the ray passes. The method also includes identifying a slave processing element associated with the portion of the three-dimensional image. The method further includes sending the ray data structure to the slave processing element.
公开/授权文献
- US08619078B2 Parallelized ray tracing 公开/授权日:2013-12-31
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/50 | .发光效果 |