Invention Application
- Patent Title: ELEMENT STRUCTURE, INERTIA SENSOR, AND ELECTRONIC DEVICE
- Patent Title (中): 元件结构,INERTIA传感器和电子设备
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Application No.: US13115632Application Date: 2011-05-25
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Publication No.: US20110291208A1Publication Date: 2011-12-01
- Inventor: Shigekazu TAKAGI
- Applicant: Shigekazu TAKAGI
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2010-121727 20100527
- Main IPC: H01L29/84
- IPC: H01L29/84

Abstract:
Manufacturing of an element structure including a capacitor is to be facilitated. An element structure includes a first substrate that has a first support layer and a first movable beam having one end supported side the first support layer and the other end having a void part provided therearound and a second substrate that has a second support layer and a first fixing electrode formed side the second support layer wherein the second substrate is disposed to face above the first substrate, the first movable beam is provided with a first movable electrode and the first fixing electrode and the first movable electrode are disposed to face each other, with a gap therebetween.
Information query
IPC分类: