Invention Application
US20110295561A1 Method of Collecting Device-Condition Information and Device-Condition Information Collecting Kit Used Therefor 有权
收集设备状态信息的方法及其使用的设备状态信息收集套件

  • Patent Title: Method of Collecting Device-Condition Information and Device-Condition Information Collecting Kit Used Therefor
  • Patent Title (中): 收集设备状态信息的方法及其使用的设备状态信息收集套件
  • Application No.: US13139805
    Application Date: 2009-12-07
  • Publication No.: US20110295561A1
    Publication Date: 2011-12-01
  • Inventor: Mamoru Nagase
  • Applicant: Mamoru Nagase
  • Applicant Address: JP Kakogawa-shi, Hyogo
  • Assignee: TLV CO., LTD.
  • Current Assignee: TLV CO., LTD.
  • Current Assignee Address: JP Kakogawa-shi, Hyogo
  • Priority: JP2008-321215 20081217
  • International Application: PCT/JP2009/070460 WO 20091207
  • Main IPC: G06F15/00
  • IPC: G06F15/00
Method of Collecting Device-Condition Information and Device-Condition Information Collecting Kit Used Therefor
Abstract:
Accurate device-condition information of and relating to a number of devices to be managed are collected in an efficient manner. The number of devices to be managed are divided between a direct collection group comprised of some managed devices whose device-condition information are collected by detecting operation by a portable (mobile) unit for device condition detection on each one of these managed devices and an indirect collection group comprised of the other managed devices whose device-condition information are collected by communication between each one of these managed devices and a stationary unit disposed to be capable of detecting the device-condition information of the device.
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