Invention Application
- Patent Title: Method of Collecting Device-Condition Information and Device-Condition Information Collecting Kit Used Therefor
- Patent Title (中): 收集设备状态信息的方法及其使用的设备状态信息收集套件
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Application No.: US13139805Application Date: 2009-12-07
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Publication No.: US20110295561A1Publication Date: 2011-12-01
- Inventor: Mamoru Nagase
- Applicant: Mamoru Nagase
- Applicant Address: JP Kakogawa-shi, Hyogo
- Assignee: TLV CO., LTD.
- Current Assignee: TLV CO., LTD.
- Current Assignee Address: JP Kakogawa-shi, Hyogo
- Priority: JP2008-321215 20081217
- International Application: PCT/JP2009/070460 WO 20091207
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
Accurate device-condition information of and relating to a number of devices to be managed are collected in an efficient manner. The number of devices to be managed are divided between a direct collection group comprised of some managed devices whose device-condition information are collected by detecting operation by a portable (mobile) unit for device condition detection on each one of these managed devices and an indirect collection group comprised of the other managed devices whose device-condition information are collected by communication between each one of these managed devices and a stationary unit disposed to be capable of detecting the device-condition information of the device.
Public/Granted literature
Information query