Invention Application
- Patent Title: FLASH MEMORY DEVICE AND READING METHOD THEREOF
- Patent Title (中): 闪存存储器件及其读取方法
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Application No.: US13155462Application Date: 2011-06-08
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Publication No.: US20110305087A1Publication Date: 2011-12-15
- Inventor: Jong-hoon Lee , Nam-hee Lee
- Applicant: Jong-hoon Lee , Nam-hee Lee
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2010-0054498 20100609
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26

Abstract:
A flash memory device wherein off cell margin is increased by controlling a voltage of a sensing node and a corresponding reading method, wherein the flash memory device includes a memory cell array; a sensing node voltage controller generating a precharge voltage and a sensing node voltage control signal; and a page buffer unit connected to the memory cell array through bit lines and having page buffers. The page buffers include a bit line connection unit connected between a corresponding bit line and a sensing node, that controls a voltage of the sensing node according to the sensing node voltage control signal; a precharge unit which precharges the sensing node according to the precharge voltage responsive to a precharge control signal; and a data input/output unit sensing a voltage level of the sensing node responsive to a latch control signal and outputting the data of the selected memory cell.
Public/Granted literature
- US08593867B2 Flash memory device and reading method thereof Public/Granted day:2013-11-26
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