发明申请
- 专利标题: Lattice Structure for Capacitance Sensing Electrodes
- 专利标题(中): 电容传感电极晶格结构
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申请号: US13198717申请日: 2011-08-05
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公开(公告)号: US20110316567A1公开(公告)日: 2011-12-29
- 发明人: Min Chin Chai , Patrick Prendergast
- 申请人: Min Chin Chai , Patrick Prendergast
- 申请人地址: US CA San Jose
- 专利权人: CYPRESS SEMICONDUCTOR CORPORATION
- 当前专利权人: CYPRESS SEMICONDUCTOR CORPORATION
- 当前专利权人地址: US CA San Jose
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; H03K17/945
摘要:
One embodiment of a capacitive sensor array may comprise a first plurality of sensor elements and a second sensor element comprising a main trace, where the main trace intersects each of the first plurality of sensor elements to form a plurality of intersections. A unit cell may be associated with each of the intersections, and each unit cell may designate a set of locations nearest to the corresponding intersection. A contiguous section of the main trace may cross at least one of the plurality of unit cells. Within each unit cell, the second sensor element may comprise at least one primary subtrace branching away from the main trace.
公开/授权文献
- US08901944B2 Lattice structure for capacitance sensing electrodes 公开/授权日:2014-12-02
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