发明申请
- 专利标题: NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- 专利标题(中): 非易失性存储器件及其制造方法
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申请号: US12973183申请日: 2010-12-20
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公开(公告)号: US20120012803A1公开(公告)日: 2012-01-19
- 发明人: Shigeto OSHINO
- 申请人: Shigeto OSHINO
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 优先权: JP2010-159415 20100714
- 主分类号: H01L45/00
- IPC分类号: H01L45/00 ; H01L21/02 ; B82Y10/00
摘要:
According to one embodiment, a nonvolatile memory device includes a lower electrode layer, a nanomaterial assembly layer, and an upper electrode layer. The nanomaterial assembly layer is provided on the lower electrode layer and includes a plurality of micro conductive bodies assembled via a gap. The upper electrode layer is provided on the nanomaterial assembly layer. The portion of the micro conductive bodies is buried at least in a lower part of the upper electrode layer.
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