发明申请
- 专利标题: CUTTING INFORMATION DETERMINATION METHOD, AND STRIP-SHAPED POLARIZING SHEET MANUFACTURING METHOD THEREWITH, OPTICAL DISPLAY UNIT MANUFACTURING METHOD THEREWITH, STRIP-SHAPED POLARIZING SHEET, AND POLARIZING SHEET MATERIAL
- 专利标题(中): 切割信息确定方法和条纹极化制造方法,其中,光学显示单元制造方法,条形偏振片和偏光片材料
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申请号: US13202730申请日: 2011-01-31
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公开(公告)号: US20120028067A1公开(公告)日: 2012-02-02
- 发明人: Akinori Izaki , Yuu Sugimoto , Seiji Umemoto
- 申请人: Akinori Izaki , Yuu Sugimoto , Seiji Umemoto
- 申请人地址: JP Ibaraki-shi, Osaka
- 专利权人: NITTO DENKO CORPORATION
- 当前专利权人: NITTO DENKO CORPORATION
- 当前专利权人地址: JP Ibaraki-shi, Osaka
- 优先权: JP2010-043250 20100226
- 国际申请: PCT/JP2011/051884 WO 20110131
- 主分类号: B29B7/00
- IPC分类号: B29B7/00 ; B26D1/00 ; B32B38/10 ; B23Q17/09
摘要:
Provided are a cutting information determination method that can use a simpler process to improve yield, and a strip-shaped polarizing sheet manufacturing method using such a method, an optical display unit manufacturing method using such a method, a strip-shaped polarizing sheet, and a polarizing sheet material. A cutting position in the width direction A2, in which a polarizing sheet material MP is to be cut along its longitudinal direction A1, is determined based on the numbers of defects counted with respect to plural points in the width direction A2 of the polarizing sheet material MP. This makes it possible to determine the cutting position in such a way that a region with many defects does not fall within the cut width, so that a higher-yield cutting position can be determined. The cutting position can also be determined using a simple process in which defects are counted with respect to plural points in the width direction A2.
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