发明申请
US20120032132A1 Nonvolatile Memory Elements And Memory Devices Including The Same
审中-公开
非易失性存储器元件和包括其的存储器件
- 专利标题: Nonvolatile Memory Elements And Memory Devices Including The Same
- 专利标题(中): 非易失性存储器元件和包括其的存储器件
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申请号: US13204138申请日: 2011-08-05
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公开(公告)号: US20120032132A1公开(公告)日: 2012-02-09
- 发明人: Seung-ryul Lee , Chang-jung Kim , Young-bae Kim , Myoung-jae Lee , Ji-hyun Hur , Dong-soo Lee , Man Chang , Chang-bum Lee
- 申请人: Seung-ryul Lee , Chang-jung Kim , Young-bae Kim , Myoung-jae Lee , Ji-hyun Hur , Dong-soo Lee , Man Chang , Chang-bum Lee
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2010-0075982 20100806
- 主分类号: H01L45/00
- IPC分类号: H01L45/00
摘要:
Nonvolatile memory elements may include a first electrode, a second electrode, a first buffer layer, a second buffer layer and a memory layer. The memory layer may be between the first and second electrodes. The first butter layer may be between the memory layer and the first electrode. The second buffer layer may be between the memory layer and the second electrode. The memory layer may be a multi-layer structure including a first material layer and a second material layer. The first material layer may include a first metal oxide which is of the same group as, or a different group from, a second metal oxide included in the second material layer.
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