Invention Application
- Patent Title: MOUNTING ACCURACY INSPECTION METHOD AND INSPECTION APPARATUS USING THE INSPECTION METHOD
- Patent Title (中): 使用检查方法安装精度检查方法和检查装置
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Application No.: US13211629Application Date: 2011-08-17
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Publication No.: US20120050487A1Publication Date: 2012-03-01
- Inventor: Kazunori MASUMURA , Koji SHIGEMURA
- Applicant: Kazunori MASUMURA , Koji SHIGEMURA
- Applicant Address: JP Kanagawa
- Assignee: NEC LCD TECHNOLOGIES, LTD.
- Current Assignee: NEC LCD TECHNOLOGIES, LTD.
- Current Assignee Address: JP Kanagawa
- Priority: JP2010-188386 20100825
- Main IPC: H04N13/02
- IPC: H04N13/02

Abstract:
A display apparatus to be inspected includes: a display panel in which pixel groups are arranged; and an optical element for providing image display for N viewpoints (N is a natural number more than one) from the pixel groups. An inspection apparatus includes: a image output device for outputting a test pattern including image signals different in the respective viewpoints to the display apparatus; and an extraction device for extracting the slope and the position of a boundary line segment in an inspection image displayed on the display apparatus. The extraction device detects positional accuracy between the display panel and the optical element on the basis of the slope and the position extracted by the extraction device.
Public/Granted literature
- US08797388B2 Mounting accuracy inspection method and inspection apparatus using the inspection method Public/Granted day:2014-08-05
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