Invention Application
US20120051507A1 X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
有权
X射线荧光分析仪和X射线荧光分析方法
- Patent Title: X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
- Patent Title (中): X射线荧光分析仪和X射线荧光分析方法
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Application No.: US13174058Application Date: 2011-06-30
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Publication No.: US20120051507A1Publication Date: 2012-03-01
- Inventor: Kiyoshi Hasegawa , Yutaka Ikku , Hideki Takiguchi
- Applicant: Kiyoshi Hasegawa , Yutaka Ikku , Hideki Takiguchi
- Priority: JP2010-193167 20100831
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
The X-ray fluorescence analyzer (100) includes: an enclosure (10); a door (20) for putting the sample into and out of the enclosure; a height measurement mechanism (7) capable of measuring a height at the irradiation point; a moving mechanism control unit (9) for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit (7) for irradiating the irradiation point with a visible light laser beam; a laser start control unit (9) for irradiating the visible light laser beam by the laser unit (7) when the door is open state; and a height measurement mechanism start control unit (9) for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.
Public/Granted literature
- US08611493B2 X-ray fluorescence analyzer and X-ray fluorescence analysis method Public/Granted day:2013-12-17
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