发明申请
- 专利标题: FAULT LOCALIZATION USING DIRECTED TEST GENERATION
- 专利标题(中): 使用指导性测试生成的故障本地化
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申请号: US12873816申请日: 2010-09-01
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公开(公告)号: US20120054552A1公开(公告)日: 2012-03-01
- 发明人: Shay Artzi , Julian Dolby , Marco Pistoia , Frank Tip
- 申请人: Shay Artzi , Julian Dolby , Marco Pistoia , Frank Tip
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F11/36
- IPC分类号: G06F11/36
摘要:
Disclosed is a novel computer implemented system, on demand service, computer program product and a method for fault-localization techniques that apply statistical analyses to execution data gathered from multiple tests. The present invention determines the fault-localization effectiveness of test suites generated according to several test-generation techniques based on combined concrete and symbolic (concolic) execution. These techniques are evaluated by applying the Ochiai fault-localization technique to generated test suites in order to localize 35 faults in four PHPWeb applications. The results show that the test-generation techniques under consideration produce test suites with similar high fault-localization effectiveness, when given a large time budget.
公开/授权文献
- US08387018B2 Fault localization using directed test generation 公开/授权日:2013-02-26
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