Invention Application
- Patent Title: INTRA-CAVITY ELLIPSOMETER SYSTEM AND METHOD
- Patent Title (中): 内部电磁阀系统及方法
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Application No.: US13265841Application Date: 2010-05-04
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Publication No.: US20120069336A1Publication Date: 2012-03-22
- Inventor: Theodore Peter Rakitzis
- Applicant: Theodore Peter Rakitzis
- International Application: PCT/IB10/01154 WO 20100504
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
A resonant optical cavity ellipsometer system is provided. The system can be used to conduct time-dependent arid sensitive measurement of ellipsometric parameters of matter. In a particular use, the system can provide time resolution abetter than 1 microsecond. In a particular implementation, matter can be probed within the evanescent wave generated by intra-cavity total reflection.
Public/Granted literature
- US08941831B2 Intra-cavity ellipsometer system and method Public/Granted day:2015-01-27
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