发明申请
- 专利标题： Millimeter Wave Imaging Apparatus and Program
- 专利标题（中）： 毫米波成像仪和程序
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申请号： US13376309申请日： 2010-06-04
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公开(公告)号： US20120075479A1公开(公告)日： 2012-03-29
- 发明人: Jun Uemura , Masamune Takeda , Kota Yamada , Junichi Takahashi , Tsuyoshi Hasegawa , Haruyuki Hirai , Hirotaka Niikura , Tomohiko Matsuzaki , Hiroyasu Sato , Kunio Sawaya , Koji Mizuno
- 申请人： Jun Uemura , Masamune Takeda , Kota Yamada , Junichi Takahashi , Tsuyoshi Hasegawa , Haruyuki Hirai , Hirotaka Niikura , Tomohiko Matsuzaki , Hiroyasu Sato , Kunio Sawaya , Koji Mizuno
- 申请人地址： JP Nisshin-shi, Aichi JP Sendai-shi, Miyagi JP Hachioji-shi, Tokyo
- 专利权人： MASPRODENKOH KABUSHIKIKAISHA,TOHOKU UNIVERSITY,CHUO ELECTRONICS CO., LTD
- 当前专利权人： MASPRODENKOH KABUSHIKIKAISHA,TOHOKU UNIVERSITY,CHUO ELECTRONICS CO., LTD
- 当前专利权人地址： JP Nisshin-shi, Aichi JP Sendai-shi, Miyagi JP Hachioji-shi, Tokyo
- 优先权： JP2009-136439 20090605
- 国际申请： PCT/JP2010/059559 WO 20100604
- 主分类号： H04N5/33
- IPC分类号： H04N5/33
摘要：
There is provided a millimeter wave imaging apparatus including: a lens antenna forming a subject image based on the millimeter waves from a subject; a line sensor including a plurality of millimeter wave sensors and capturing an image for one line of a predetermined width of the whole subject; a reflector having a reflecting surface reflecting millimeter waves; a reflection angle change device changing an angle of the reflecting surface; an image generation device generating an image of the whole subject from the respective subject images for one line; a millimeter wave radiation unit radiating a reference millimeter wave; a correction value setting device setting correction values with respect to the detected values by the millimeter wave sensors based on the millimeter wave from the millimeter wave radiation unit; and a detected value correction device correcting the detected values by the millimeter wave sensors with the correction values.