Invention Application
US20120079161A1 CIRCUIT FOR SIMULTANEOUSLY ANALYZING PERFORMANCE AND BUGS AND METHOD THEREOF 有权
同时分析性能和电阻的电路及其方法

CIRCUIT FOR SIMULTANEOUSLY ANALYZING PERFORMANCE AND BUGS AND METHOD THEREOF
Abstract:
A circuit for simultaneously analyzing performance and bugs includes a mapping unit and a USB 3.0 data flow analyzer. The mapping unit is used for mapping commands transmitted to a USB 3.0 host through a peripheral component interconnect express and internal events of the USB 3.0 host to a packet of a USB 3.0 bus. The USB 3.0 data flow analyzer is used for analyzing performance and bugs of the USB 3.0 host through the packet of the USB 3.0 bus.
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